Optical characterization of inhomogeneous thin films with randomly rough boundaries VOHÁNKA, Jiří, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ, Petr KLAPETEK a Nupinder Jeet KAUR (2022) (info)

Constitutive equations describing optical activity in theory of dispersion FRANTA, Daniel a Jiří VOHÁNKA (2021) (info)

Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy ŠUSTEK, Štěpán, Jiří VOHÁNKA, Ivan OHLÍDAL, Miloslav OHLÍDAL, Václav ŠULC, Petr KLAPETEK a Nupinder Jeet KAUR (2021) (info)

Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization OHLÍDAL, Ivan, Jiří VOHÁNKA a Martin ČERMÁK (2021) (info)

Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model FRANTA, Daniel a Mihai-George MURESAN (2021) (info)

A comparative study of sioxcyhz thin films deposited in trimethysilyl ACETATE/O2/Ar plasmas KELAROVÁ, Štěpánka, Roman PŘIBYL, Vojtěch HOMOLA, Lukáš ZÁBRANSKÝ, Monika STUPAVSKÁ, Martin ČERMÁK a Vilma BURŠÍKOVÁ (2020) (info)

Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge KELAROVÁ, Štěpánka, Vojtěch HOMOLA, Monika STUPAVSKÁ, Martin ČERMÁK, Jiří VOHÁNKA, Roman PŘIBYL, Lukáš ZÁBRANSKÝ a Vilma BURŠÍKOVÁ (2020) (info)

Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry VOHÁNKA, Jiří, Štěpán ŠUSTEK, Vilma BURŠÍKOVÁ, Veronika ŠKLÍBOVÁ, Václav ŠULC, Vojtěch HOMOLA, Daniel FRANTA, Martin ČERMÁK, Miloslav OHLÍDAL a Ivan OHLÍDAL (2020) (info)

Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials VOHÁNKA, Jiří, Daniel FRANTA, Martin ČERMÁK, Vojtěch HOMOLA, Vilma BURŠÍKOVÁ a Ivan OHLÍDAL (2020) (info)

Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Václav ŠULC, Štěpán ŠUSTEK a Miloslav OHLÍDAL (2020) (info)

Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism ČERMÁK, Martin, Jiří VOHÁNKA, Daniel FRANTA a Ivan OHLÍDAL (2020) (info)

Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA a Martin ČERMÁK (2020) (info)

Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions FRANTA, Daniel (2020) (info)

Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films OHLÍDAL, Ivan, Jiří VOHÁNKA, Daniel FRANTA, Martin ČERMÁK, Jaroslav ŽENÍŠEK a Petr VAŠINA (2019) (info)

Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK, František VIŽĎA a Daniel FRANTA (2019) (info)

Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA (2019) (info)

Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory VOHÁNKA, Jiří, Martin ČERMÁK, Daniel FRANTA a Ivan OHLÍDAL (2019) (info)

Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions VOHÁNKA, Jiří, David NEČAS a Daniel FRANTA (2019) (info)

Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA (2019) (info)

Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects VOHÁNKA, Jiří, Ivan OHLÍDAL, Miloslav OHLÍDAL, Štěpán ŠUSTEK, Martin ČERMÁK, Václav ŠULC, Petr VAŠINA, Jaroslav ŽENÍŠEK a Daniel FRANTA (2019) (info)

Optical properties of the crystalline silicon wafers described using the universal dispersion model FRANTA, Daniel, Jiří VOHÁNKA, Martin BRÁNECKÝ, Pavel FRANTA, Martin ČERMÁK, Ivan OHLÍDAL a Vladimír ČECH (2019) (info)

Temperature dependent dispersion models applicable in solid state physics FRANTA, Daniel, Jiří VOHÁNKA, Martin ČERMÁK, Pavel FRANTA a Ivan OHLÍDAL (2019) (info)

Amorphous gallium oxide grown by low-temperature PECVD KOBAYASHI, Eiji, Mathieu BOCCARD, Quentin JEANGROS, Nathan RODKEY, Daniel VRESILOVIC, Aïcha HESSLER-WYSER, Max DÖBELI, Daniel FRANTA, Stefaan DE WOLF, Monica MORALES-MASIS a Christophe BALLIF (2018) (info)

Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region FRANTA, Daniel, Pavel FRANTA, Jiří VOHÁNKA, Martin ČERMÁK a Ivan OHLÍDAL (2018) (info)

Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence HOLOVSKÝ, Jakub, Zdeněk REMEŠ, Aleš PORUBA, Daniel FRANTA, Briana CONRAD, Lucie ABELOVÁ a David BUŠEK (2018) (info)

Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution VODÁK, Jiří, David NEČAS, Miloslav OHLÍDAL a Ivan OHLÍDAL (2017) (info)

Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model FRANTA, Daniel, Martin ČERMÁK, Jiří VOHÁNKA a Ivan OHLÍDAL (2017) (info)

Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness OHLÍDAL, Ivan, Daniel FRANTA a David NEČAS (2017) (info)

Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry FRANTA, Daniel, Minna Paula Katriina KOTILAINEN, Richard KRUMPOLEC a Ivan OHLÍDAL (2017) (info)

Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA (2017) (info)

Temperature-dependent dispersion model of float zone crystalline silicon FRANTA, Daniel, Adam DUBROKA, Chennan WANG, Angelo GIGLIA, Jiří VOHÁNKA, Pavel FRANTA a Ivan OHLÍDAL (2017) (info)

Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride FRANTA, Daniel, David NEČAS, Angelo GIGLIA, Pavel FRANTA a Ivan OHLÍDAL (2017) (info)

Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Angelo GIGLIA (2016) (info)

Dispersion model for optical thin films applicable in wide spectral range FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Angelo GIGLIA (2015) (info)

Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films OHLÍDAL, Miloslav, Ivan OHLÍDAL, David NEČAS, Jiří VODÁK, Daniel FRANTA, Pavel NÁDASKÝ a František VIŽĎA (2015) (info)

Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry NEČAS, David, Ivan OHLÍDAL, Jiří VODÁK, Miloslav OHLÍDAL a Daniel FRANTA (2015) (info)

Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia FRANTA, Daniel, David NEČAS a Ivan OHLÍDAL (2015) (info)

Wide spectral range characterization of antireflective coatings and their optimization FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Jiří JANKUJ (2015) (info)

Broadening of dielectric response and sum rule conservation FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL (2014) (info)

Dispersion model of two-phonon absorption: application to c-Si FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL (2014) (info)

Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces OHLÍDAL, Ivan, Daniel FRANTA a David NEČAS (2014) (info)

Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL (2014) (info)

MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD MOCANU, Valentin, Adrian STOICA, Lukáš KELAR, Daniel FRANTA, Vilma BURŠÍKOVÁ, Romana MIKSOVA a Vratislav PERINA (2012) (info)

Anisotropy-enhanced depolarization on transparent film/substrate system FRANTA, Daniel, David NEČAS a Ivan OHLÍDAL (2011) (info)

Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ a Christoph COBET (2011) (info)

Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture ZAJÍČKOVÁ, Lenka, Daniel FRANTA, David NEČAS, Vilma BURŠÍKOVÁ, Mihai George MURESAN, Vratislav PEŘINA a Christoph COBET (2011) (info)

Ellipsometric characterisation of thin films non-uniform in thickness NEČAS, David, Daniel FRANTA, Vilma BURŠÍKOVÁ a Ivan OHLÍDAL (2011) (info)

Measurement of the thickness distribution and optical constants of non-uniform thin films OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, David NEČAS a Abhijit MAJUMDAR (2011) (info)

Mechanical Properties of Ultrananocrystalline Thin Films Deposited Using Dual Frequency Discharges BURŠÍKOVÁ, Vilma, Olga BLÁHOVÁ, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Daniel FRANTA, Petr KLAPETEK a Jiří BURŠÍK (2011) (info)

Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry OHLÍDAL, Ivan, Miloslav OHLÍDAL, David NEČAS, Daniel FRANTA a Vilma BURŠÍKOVÁ (2011) (info)

Optical characterization of HfO2 thin films FRANTA, Daniel, Ivan OHLÍDAL, David NEČAS, František VIŽĎA, Ondřej CAHA, Martin HASOŇ a Pavel POKORNÝ (2011) (info)

Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films NEČAS, David, Ivan OHLÍDAL a Daniel FRANTA (2011) (info)

Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ a Christoph COBET (2010) (info)

Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge TRUNEC, David, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Filip STUDNIČKA, Pavel SŤAHEL, Vadym PRYSIAZHNYI, Vratislav PEŘINA, Jana HOUDKOVÁ, Zdeněk NAVRÁTIL a Daniel FRANTA (2010) (info)

Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, David NEČAS a Vilma BURŠÍKOVÁ (2009) (info)

Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL, Martin HRDLIČKA, Martin PAVLIŠTA, Miloslav FRUMAR a Miloslav OHLÍDAL (2009) (info)

Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry OHLÍDAL, Ivan, David NEČAS, Daniel FRANTA a Vilma BURŠÍKOVÁ (2009) (info)

Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates. VIZDA, Frantisek, Ivan OHLÍDAL a Vojtech HRUBY (2009) (info)

Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Vilma BURŠÍKOVÁ (2009) (info)

Modeling of dielectric response of GexSbyTez (GST) materials FRANTA, Daniel, David NEČAS a Miloslav FRUMAR (2009) (info)

Optical Characterization of Ultra-Thin Iron and Iron Oxide Films NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA a Miroslav VALTR (2009) (info)

Reflectance of non-uniform thin films NEČAS, David, Ivan OHLÍDAL a Daniel FRANTA (2009) (info)

Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane ZAJÍČKOVÁ, Lenka, Zuzana KUČEROVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Vratislav PEŘINA a Anna MACKOVÁ (2008) (info)

Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge BURŠÍKOVÁ, Vilma, Vratislav PEŘINA, Jaroslav SOBOTA, Petr KLAPETEK, Pavel DVOŘÁK, Adrian STOICA, Jiří BURŠÍK a Daniel FRANTA (2008) (info)

Influence of cross-correlation effects on the optical quantities of rough films. FRANTA, Daniel, Ivan OHLÍDAL a David NEČAS (2008) (info)

Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films. OHLÍDAL, Ivan a David NEČAS (2008) (info)

Modeling of optical constants of diamond-like carbon FRANTA, Daniel, Vilma BURŠÍKOVÁ, David NEČAS a Lenka ZAJÍČKOVÁ (2008) (info)

Optical characterization of non-stoichiometric silicon nitride films NEČAS, David, Vratislav PEŘINA, Daniel FRANTA, Ivan OHLÍDAL a Josef ZEMEK (2008) (info)

Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films FRANTA, Daniel, Martin HRDLIČKA, David NEČAS, Miloslav FRUMAR, Ivan OHLÍDAL a Martin PAVLIŠTA (2008) (info)

Optical Characterization of Ultrananocrystalline Diamond Films FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Monika KARÁSKOVÁ, Ondřej JAŠEK, David NEČAS, Petr KLAPETEK a Miroslav VALTR (2008) (info)

Optical quantities of rough films calculated by Rayleigh-Rice theory FRANTA, Daniel, Ivan OHLÍDAL a David NEČAS (2008) (info)

Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies OHLÍDAL, Ivan, David NEČAS a Daniel FRANTA (2008) (info)

Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL a Daniel FRANTA (2008) (info)

Atomic force microscopy studies of cross-sections of columnar films KLAPETEK, Petr, Ivan OHLÍDAL a Jiří BURŠÍK (2007) (info)

Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Daniel FRANTA, Angelique BOUSQUET, Agnes GRANIER, Antoine GOULLET a Jiří BURŠÍK (2007) (info)

Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Pavel SŤAHEL, Miloslav OHLÍDAL a David NEČAS (2007) (info)

Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings BURŠÍKOVÁ, Vilma, Pavel DVOŘÁK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, Jaroslav SOBOTA, Petr KLAPETEK, Olga BLÁHOVÁ a Vratislav PEŘINA (2007) (info)

Deposition of protective coatings in rf organosilicon discharges ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Zuzana KUČEROVÁ, Daniel FRANTA, Pavel DVOŘÁK, Radek ŠMÍD, Vratislav PEŘINA a Anna MACKOVÁ (2007) (info)

Models of dielectric response in disordered solids FRANTA, Daniel, David NEČAS a Lenka ZAJÍČKOVÁ (2007) (info)

Study of thickness reduction of a-C:H thin film under UV light irradiation VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL a Václav DUCHOŇ (2007) (info)

UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL a Daniel FRANTA (2007) (info)

Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films OHLÍDAL, Ivan, Daniel FRANTA, Martin ŠILER, František VIŽĎA, Miloslav FRUMAR, Jaroslav JEDELSKÝ a Jaroslav OMASTA (2006) (info)

Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge ŠÍRA, Martin, David TRUNEC, Pavel SŤAHEL, Vilma BURŠÍKOVÁ a Daniel FRANTA (2006) (info)

Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation FRGALA, Zdeněk, Ondřej JAŠEK, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ, Antonin REK, Petr KLAPETEK a Jiří BURŠÍK (2006) (info)

Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry VALTR, Miroslav, Ivan OHLÍDAL a Daniel FRANTA (2006) (info)

Influence of technological conditions on mechanical stresses inside diamond-like carbon films. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ, Petr KLAPETEK a Kateřina PÁLENÍKOVÁ (2005) (info)

Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Lenka ZAJÍČKOVÁ a Pavel SŤAHEL (2005) (info)

Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation KLAPETEK, Petr, Ivan OHLÍDAL a Karel NAVRÁTIL (2004) (info)

Optical properties of diamond-like carbon films containing SiOx FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ (2003) (info)

Optical Characterization of Diamond-like Carbon Films FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL a Jan JANČA (2001) (info)

XPS and Ellipsometric Study of DLC/Silicon Interface ZAJÍČKOVÁ, Lenka, Kateřina VELTRUSKÁ, Nataliya TSUD a Daniel FRANTA (2001) (info)

The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ a Daniel FRANTA (1999) (info)

Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses ZAJÍČKOVÁ, Lenka, Ivan OHLÍDAL a Jan JANČA (1996) (info)

Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries OHLÍDAL, Ivan, František VIŽĎA a Miloslav OHLÍDAL (1995) (info)

Influence of defects of thin films on determining their thickness by the method based on white light interference. MUSILOVÁ, Jana a Ivan OHLÍDAL (1993) (info)