Optics for Thin films and Solid surfaces

Research group at Department of Physical Electronics MU

Offered final thesis topics:

  • Optical characterization of fluoride thin films
  • Characterization of randomly rough surfaces using optical methods and atomic force microscopy.

 


Active studies:

Determination of the optical constants of thin substrates in the infrared region (master thesis, Jiří Večeře)

Optical properties of non-stoichioemetric silicon nitride thin films prepared by reactive magnetron sputtering (master thesis, Martin Málek)

 


Absolventi:

2021

Determination of the optical constants and structural parameters of DLC thin films with silicon and oxygen admixtures (bachelor thesis, Pavlína Kührová)


2020

Determination of the width of a spectral line of spectrophotometers for various settings of spectral resolution (bachelor thesis, Jiří Večeře)

Determination of thicknesses and optical constants of non-uniform polymer thin films (bachelor thesis, Veronika Šklíbová)


2019

Optical characterization of silicon nitride thin films (bachelor thesis, Martin Málek)


2018

Determination of the optical constants and thicknesses of silicon nitride thin films (bachelor thesis, Diana Csontosová)

Optical characterization of WBC films (bachelor thesis, Lukáš Rychnovský)


2013

Optical characterisation of non-uniform thin films (dissertation, David Nečas)


2010

Deposition of hydrocarbon thin films in plasma and study of their properties (dissertation, Miroslav Valtr)


 

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