Optics for Thin films and Solid surfaces
Research group at Department of Physical Electronics MU
Ellipsometry
Horiba Jobin Yvon UVISEL
- spectral range: 0.6 - 6.5 eV
- angles of incidence: 55° - 90°
- X-Y mapping table
Woollam IR-VASE
- spectral range: 300 - 6500 cm-1
- angles of incidence: 25° - 90°
- reflection and transmission mode
Horiba Jobin Yvon UVISEL2 VUV
- spectral range: 0.6 - 8.5 eV
- fix angle of incidence at 70°
- vakuum measurement
- possibility of sample heating
Spectrophotometry
Perkin Elmer Lambda 1050
- spectral range: 0.38-6.6 eV
- sample holder for perpendicular incidence for transmittance measurements
- stage for reflection measurements (AOI = 6°)
Bruker Vertex 80v
- spectral range: 70 - 7000 cm-1
- sample holder for perpendicular incidence for transmittance measurements
- stage for reflection measurements (AOI = 7°)
- vakuum measurement