Optics for Thin films and Solid Surfaces

Research group at the Department of Plasma Physics and Technology​​​​​

The research group Optics of Thin Films and Solid Surfaces of the DPPT is part of the CEPLANT Centre. We focus on the optical properties of thin film and solid surface systems and the optical characterization of these systems. These include, for example, layers prepared by plasma chemical methods, magnetron sputtering, or vacuum sputtering.

We develop and formulate new dispersion and structure models, which are then used in optical characterization. The structural models include defects such as random interface roughness, layer inhomogeneity, thickness non-uniformity, intermediate layer transitions, and others. Our optical laboratory has spectrophotometers and ellipsometers covering a wide spectral range from the far infrared to the vacuum ultraviolet region.

No description
Our team

No description

prof. RNDr. Ivan Ohlídal, DrSc.

leader of the reasearch group
Scopus Author ID: 7006927546

549 49 6244
ohlidal(at)sci.muni.cz

Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno

Loading map…

No description

Mgr. Jiří Vohánka, Ph.D.

Scopus Author ID: 35231410500

549 49 3357
vohanka(at)physics.muni.cz

No description

Mgr. Daniel Franta, Ph.D.

Scopus Author ID: 22946971100

549 49 3836
dfranta(at)sci.muni.cz

No description

Mgr. Jan Dvořák, Ph.D.

Scopus Author ID: 57206782608

549 49 3357
jdvorak(at)physics.muni.cz

No description

Ing. Pavel Franta

technician

549 49 3709
pfranta(at)mail.muni.cz

Equipment

Ellipsometry​

Spectrophotometry

No description
Horiba Jobin Yvon UVISEL
  • spectral range: 0.6 - 6.5 eV
  • angles of incidence: 55° - 90°
  • X-Y mapping table
No description
Perkin Elmer Lambda 1050+
  • spectral range: 0.38-6.6 eV
  • measuring of layered systems transmittance
  • stage for reflection measurements (AOI = 6°)
  • measuring of transmittance of fluids in cuvettes
  • URA detector for reflectance measurements at different angles of incidence (8°-65°)
No description
Woollam IR-VASE
  • spectral range: 300 - 6500 cm-1
  • angles of incidence: 25° - 90°
  • reflection and transmission mode
No description
Bruker Vertex 80v
  • spectral range: 70 - 7000 cm-1
  • sample holder for perpendicular incidence for transmittance measurements
  • stage for reflection measurements (AOI = 7°)
  • vacuum measurement
No description
Horiba Jobin Yvon UVISEL2 VUV
  • spectral range: 0.6 - 8.5 eV
  • fix angle of incidence 70°
  • vacuum measurement
  • possibility of sample heating
Cooperation

No description

Bundesanstalt für Materialforschung und -prüfung (BAM)

Berlin, Germany

 

No description

Czech metrology institute

Brno, Czech Republic

 

No description

Fraunhofer-Institut für Angewandte Optik und Feinmechanik

Jena, Germany

 

No description

Faculty of Mechanical Engineering, Brno University of Technology

Brno, Czech Republic

 

No description

Hilase Centre, Institute of Physics, Academy of Sciences of the Czech Republic

Dolní Břežany, Czech Republic

 

No description

Friedrich-Schiller-Universität

Jena, Germany

 

No description

Johannes Kepler Universität Linz

Linz, Austria

 

No description

LENA Laboratory for Emerging Nanometrology, Technische Universität Braunschweig

Braunschweig, Germany

 

No description

Meopta - optika, s.r.o.

Přerov, Czech Republic

 

No description

Physikalisch-Technische Bundesanstalt

Braunschweig, Germany

 

No description

TTS, s.r.o. - Thin film technological service

Praha, Czech Republic

 

No description

Varroc Lighting Systems, s.r.o.

Nový Jičín, Czech Republic

 

Students and alumni

Offered final thesis topics

  • Optical characterization of fluoride thin films
  • Characterization of randomly rough surfaces using optical methods and atomic force microscopy

Active studies

Beáta Hroncová


Alumni

Publications

Previous 1 2 3 Next

You are running an old browser version. We recommend updating your browser to its latest version.

More info